Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, (Paperback)

Name: Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, (Paperback)
Brand: Alberto Bosio
SKU: prod_ce7deb2a6c89924f0505d95e
Price: 203.00 USD
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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, (Paperback) Author: Springer ISBN: 9781489983145 Format: Paperback Publication Date: 2014-09-03 Page Count: 171

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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, (Paperback)—

$203.00

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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, (Paperback)—

$203.00