Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in Nanocmos, (Paperback)

Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in Nanocmos, (Paperback) Author: Springer ISBN: 9783319840413 Format: Paperback Publication Date: 2018-07-05 Page Count: 118

Shipping & Returns

Product image 1
Price unavailable
Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in Nanocmos, (Paperback)
$118.00