Frontiers in Electronic Testing From Contamination to Defects, Faults and Yield Loss: Simulation and Applications, Book 5, (Paperback)

Name: Frontiers in Electronic Testing From Contamination to Defects, Faults and Yield Loss: Simulation and Applications, Book 5, (Paperback)
Brand: Jitendra B Khare
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Price: 192.00 USD
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Frontiers in Electronic Testing From Contamination to Defects, Faults and Yield Loss: Simulation and Applications, Book 5, (Paperback) Author: Springer ISBN: 9781461285953 Format: Paperback Publication Date: 2011-09-26 Page Count: 150

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Frontiers in Electronic Testing From Contamination to Defects, Faults and Yield Loss: Simulation and Applications, Book 5, (Paperback)—

$192.00

Price unavailable

Frontiers in Electronic Testing From Contamination to Defects, Faults and Yield Loss: Simulation and Applications, Book 5, (Paperback)—

$192.00