Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Hardcover)

Name: Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Hardcover)
Brand: Said Hamdioui
SKU: prod_67397ad34df74a2b862a6bc2
Price: 188.00 USD
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Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Hardcover) Author: Springer ISBN: 9781402077524 Format: Hardcover Publication Date: 2004-03-31 Page Count: 221

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Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Hardcover)—

$188.00

Price unavailable

Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Hardcover)—

$188.00