Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Paperback)

Name: Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Paperback)
Brand: Said Hamdioui
SKU: prod_aa3e33471267909e53b1a5e1
Price: 216.00 USD
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Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Paperback) Author: Springer ISBN: 9781441954305 Format: Paperback Publication Date: 2010-12-09 Page Count: 221

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Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Paperback)—

$216.00

Price unavailable

Frontiers in Electronic Testing Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Book 26, (Paperback)—

$216.00