Quality and Reliability Engineering Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy, (Hardcover)

Name: Quality and Reliability Engineering Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy, (Hardcover)
Brand: Wai Kin Chim
SKU: prod_a96962cddff620738d263b51
Price: 396.00 USD
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Quality and Reliability Engineering Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy, (Hardcover) Author: Wiley ISBN: 9780471492405 Format: Hardcover Publication Date: 2000-12-22 Page Count: 288

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Quality and Reliability Engineering Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy, (Hardcover)—

$396.00

Price unavailable

Quality and Reliability Engineering Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy, (Hardcover)—

$396.00