Recent Advances in Pmos Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Mat, (Paperback)

Name: Recent Advances in Pmos Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Mat, (Paperback)
Brand: Souvik Mahapatra
SKU: prod_53fcd8de8848237b54675242
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Recent Advances in Pmos Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Mat, (Paperback) Author: Springer ISBN: 9789811661228 Format: Paperback Publication Date: 2022-11-27 Page Count: 311

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Recent Advances in Pmos Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Mat, (Paperback)—

$298.00

Price unavailable

Recent Advances in Pmos Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Mat, (Paperback)—

$298.00