Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, (Paperback)

Name: Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, (Paperback)
Brand: Fred Stevie
SKU: prod_b00ae1c078f5ca1c8bd747c5
Price: 131.00 USD
Availability: InStock

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, (Paperback) Author: Momentum Press ISBN: 9781606505885 Format: Paperback Publication Date: 2015-09-15 Page Count: 277

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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, (Paperback)—

$131.00

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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, (Paperback)—

$131.00